ePrints

Capacitance-voltage (C-V) technique for the characterisation of stained Si/Si1-xGex hetero-structure MOS devices

Lookup NU author(s): Dr Sanatan Chattopadhyay, John Varzgar, Dr Johan Seger, Dr Yuk Tsang, Dr Kelvin Kwa, Dr Sarah Olsen, Professor Anthony O'Neill

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Publication metadata

Author(s): Chattopadhyay S, Varzgar JB, Seger J, Tsang YL, Kwa KSK, Olsen SH, O'Neill AG

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Unknown

Conference Name: EMPDS (Electronic and Photonic Materials, Devices and Systems)

Year of Conference: 2006

Share