ePrints

Strained Si/strained SiGe/relaxed SiGe structures: identifying roughness due to compressed SiGe and its impact on high mobility MOSFETs

Lookup NU author(s): Dr Enrique Escobedo-Cousin, Dr Sarah Olsen, Professor Anthony O'Neill, Layi Alatise, Rouzet Agaiby, Dr Piotr Dobrosz

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Publication metadata

Author(s): Escobedo-Cousin E, Olsen SH, O'Neill AG, Alatise OM, Agaiby RMB, Dobrosz P, Braithwaite G, Cuthbertson A, Grasby T, Parker EHC

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Unknown

Conference Name: Materials REsearch Society Conference (MRS)

Year of Conference: 2007

Share