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Following the oxidation of yttrium silicide epitaxially grown on Si(1 1 1) by core level photoemission spectroscopy

Lookup NU author(s): Dr Celia Rogero

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Abstract

We have identified, by means of synchrotron radiation X-ray photoemission spectroscopy, several core-level shifted components in the Si-2p photoemission core level peak from a thin yttrium silicide layer epitaxially grown on a Si(1 1 1) surface. We have unequivocally assigned these components to different environments of the Si atoms in the silicide structure. This information has been used to monitor a surface oxidation process promoted by room temperature oxygen adsorption, identifying the final product of this reaction as a silicate-type ternary compound. © 2005 Elsevier B.V. All rights reserved.

Publication metadata

Author(s): Rogero C, Lizzit S, Goldoni A, Martin-Gago JA

Publication type: Article

Publication status: Published

Journal: Surface Science

Year: 2006

Volume: 600

Issue: 4

Pages: 841-846

ISSN (print): 0039-6028

ISSN (electronic):

Publisher: Elsevier

URL: http://dx.doi.org/10.1016/j.susc.2005.12.011

DOI: 10.1016/j.susc.2005.12.011

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