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The Thickogram: a method for easy film-thickness measurement in XPS

Lookup NU author(s): Professor Peter Cumpson

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Publication metadata

Author(s): Cumpson PJ

Publication type: Article

Publication status: Published

Journal: Surface and Interface Analysis

Year: 2000

Volume: 29

Issue: 6

Pages: 403-406

ISSN (print): 0142-2421

ISSN (electronic): 1096-9918

Publisher: John Wiley & Sons

URL: http://dx.doi.org/10.1002/1096-9918(200006)29:6<403::AID-SIA884>3.0.CO;2-8

DOI: 10.1002/1096-9918(200006)29:6<403::AID-SIA884>3.0.CO;2-8

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