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Wafer Region Yield Prediction: Employing Majority Under-Sampling and Output Binarization on Low-Yield Threshold

Lookup NU author(s): Dr Aastha Sharma, Professor Cheng Chin

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Publication metadata

Author(s): Lim MYS, Sharma A, Chin CS

Publication type: Article

Publication status: Published

Journal: IEEE Access

Year: 2025

Volume: 13

Pages: 55104-55112

Print publication date: 03/04/2025

Online publication date: 26/03/2025

Acceptance date: 21/03/2025

Date deposited: 08/04/2025

ISSN (electronic): 2169-3536

Publisher: IEEE

URL: https://doi.org/10.1109/ACCESS.2025.3554525

DOI: 10.1109/ACCESS.2025.3554525

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