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Graph embedding-based Bayesian network for fault isolation in complex equipment

Lookup NU author(s): Dr Manuel HerreraORCiD

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Author(s): Xia L, Zheng P, Herrera M, Liang Y, Li X, Gao L

Publication type: Article

Publication status: Published

Journal: IEEE Transactions on Reliability

Year: 2024

Pages: epub ahead of print

Online publication date: 09/07/2024

Acceptance date: 03/07/2024

ISSN (print): 0018-9529

ISSN (electronic): 1558-1721

Publisher: IEEE

URL: https://doi.org/10.1109/TR.2024.3416064

DOI: 10.1109/TR.2024.3416064

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