ePrints

Lifetime Reliability Characterization of N/MEMS Used in Power Gating of Digital Integrated Circuits

Lookup NU author(s): Sam Alrudainy, Professor Rishad Shafik, Dr Andrey Mokhov, Professor Alex Yakovlev

Downloads

Full text for this publication is not currently held within this repository. Alternative links are provided below where available.

Publication metadata

Author(s): Alrudainy H, Shafik R, Mokhov A, Yakovlev A

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Year of Conference: 2018

Online publication date: 04/01/2018

Acceptance date: 04/07/2017

ISSN: 2377-7966

Publisher: IEEE

URL: https://doi.org/10.1109/DFT.2017.8244452

DOI: 10.1109/DFT.2017.8244452

Library holdings: Search Newcastle University Library for this item

ISBN: 9781538603628

Share