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Lookup NU author(s): Hong Zhang, Dr Bin Gao, Professor Gui Yun TianORCiD, Dr Wai Lok Woo, Anthony Simm
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Microwave nondestructive testing and evaluation (NDT&E) has tremendous potential for defect detection in metallic materials. In this paper: 1) an open-ended waveguide-based scanning system operating in the X-band (8.2-12.4 GHz) with a spatial-frequency feature extraction algorithm for defect detection at large lift-offs is presented; 2) a full mathematical derivation for modeling the spatial-frequency characteristics in the presence of defects and without defects is provided; and 3) a spatial-frequency feature extraction algorithm using the Itakura-Saito nonnegative matrix factorization is developed and investigated. The algorithm has the unique property of scale-invariance, which enables extraction of spatial-frequency features that are characterized by large dynamic ranges of energy. To evaluate the proposed technique, four defects in an aluminium plate with different depths (from 2 to 8 mm) and one tiny defect on a steel sample (0.45-mm width and 0.43-mm depth) have been examined. Experimental results have demonstrated that the proposed microwave NDT&E technique is capable of detecting defects at large lift-offs, with the potential of estimating the width and depth of defects, as well as classifying the different defect and nondefect areas.
Author(s): Zhang H, Gao B, Tian GY, Woo WL, Simm A
Publication type: Article
Publication status: Published
Journal: IEEE Sensors Journal
Year: 2014
Volume: 14
Issue: 6
Pages: 1822-1830
Print publication date: 03/02/2014
ISSN (print): 1530-437X
ISSN (electronic): 1558-1748
Publisher: IEEE
URL: http://dx.doi.org/10.1109/JSEN.2014.2303832
DOI: 10.1109/JSEN.2014.2303832
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