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Statistical analysis of crosstalk-induced errors for on-chip interconnects

Lookup NU author(s): Dr Basel Halak, Professor Alex Yakovlev

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Abstract

The impact of crosstalk noise on the resilience of on-chip communication links in the presence of parametric variations is investigated. A novel metric called crosstalk error rate is developed which can be a valuable tool for designers to predict the crosstalk effects and explore interconnect design techniques in order to achieve the target performance with minimum overheads. Closed-form expressions of crosstalk error rate are presented. This metric is used to compare different crosstalk avoidance methods in the 90 nm technology.

Publication metadata

Author(s): Halak B, Yakovlev A

Publication type: Article

Publication status: Published

Journal: IET Computers and Digital Techniques

Year: 2011

Volume: 5

Issue: 2

Pages: 104-112

Print publication date: 01/03/2011

ISSN (print): 1751-8601

ISSN (electronic): 1751-861X

Publisher: The Institution of Engineering and Technology

URL: http://dx.doi.org/10.1049/iet-cdt.2009.0054

DOI: 10.1049/iet-cdt.2009.0054

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