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Self-Checking Circuits for Security Applications

Lookup NU author(s): Dr Alex Bystrov, Professor Alex Yakovlev

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Publication metadata

Author(s): Murphy J, Bystrov A, Yakovlev A

Publication type: Conference Proceedings (inc. Abstract)

Publication status: Published

Conference Name: 11th Annual International Mixed-Signals Testing Workshop (IMSTW’05)

Year of Conference: 2005

Pages: 278-285

Publisher: IEEE Computer Society


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